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IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components
STANDARD published on 31.8.2010
Designation standards: IEEE C62.35-2010
Note: WITHDRAWN
Publication date standards: 31.8.2010
SKU: NS-417567
The number of pages: 26
Approximate weight : 78 g (0.17 lbs)
Country: International technical standard
Category: Technical standards IEEE
Latest update: 2024-07-18 (Number of items: 2 337 971)
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