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IEEE P1149.4
IEEE Approved Draft Standard for a Mixed-Signal Test Bus
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STANDARD published on 25.12.2024
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The information about the standard:
Designation standards: IEEE P1149.4
Publication date standards: 25.12.2024
SKU: NS-1203722
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Annotation of standard text IEEE P1149.4 :
Revision Standard - Active - Draft.
The testability structure for digital c 1 ircuits described in IEEE Std 1149.1 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the means of control of and access to, both analog and digital test data. Sample implementation and application details (which are not part of the standard) are included for illustration. Also, extensions to the standard BSDL are defined that allow description of key component-specific aspects of such testability features.
ISBN: 979-8-8557-0776-2, 979-8-8557-0776-2
Number of Pages: 110
Product Code: STDUD26965, STDAPE26965
Keywords: analog test, board testing, boundary scan, BSDL, design for testability, IEEE 1149.4, in-circuit test, mixed-signal test
Category: Test Technology
Draft Number: P1149.4/D2, Feb 2024 - UNAPPROVED DRAFT, P1149.4/D2, Feb 2024 - APPROVED DRAFT
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