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Measurement of Radiated Emissions from Integrated Circuits—TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)
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STANDARD published on 1.1.2003
Designation standards: SAE J1752/3
Note: Historical
Publication date standards: 1.1.2003
SKU: NS-840561
Country: American technical standard
Category: Technical standards SAE
Latest update: 2024-07-17 (Number of items: 2 331 085)
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