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Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
STANDARD published on 1.12.2000
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Designation standards: STN EN 60444-2
Classification mark: 358490
Catalog number: 16648
Publication date standards: 1.12.2000
SKU: NS-527081
The number of pages: 12
Approximate weight : 36 g (0.08 lbs)
Country: Slovak technical standard
Category: Technical standards STN
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