WITHDRAWN STN EN 60749 1.8.2001 preview

STN EN 60749 (358799)

Semiconductor devices. Mechanical and climatic test methods



STANDARD published on 1.8.2001


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The information about the standard:

Designation standards: STN EN 60749
Classification mark: 358799
Catalog number: 18009
Note: WITHDRAWN
Publication date standards: 1.8.2001
SKU: NS-528343
The number of pages: 52
Approximate weight : 156 g (0.34 lbs)
Country: Slovak technical standard
Category: Technical standards STN

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