We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
Semiconductor devices - Mechanical and climatic test methods Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
STANDARD published on 1.4.2013
Language | |
Format |
|
Availability | The sale has ended |
Price | ON REQUEST excl. VAT |
ON REQUEST |
Designation standards: STN EN 60749-27:2007/A1
Classification mark: 358799
Catalog number: 116779
Note: Change
Publication date standards: 1.4.2013
SKU: NS-528316
Approximate weight : 18 g (0.04 lbs)
Country: Slovak technical standard
Category: Technical standards STN
Semiconductor devices - Mechanical and climatic test methods Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Standard published on 1.5.2007
Selected format:
Do you want to be sure about the validity of used regulations?
We offer you a solution so that you could use valid and updated legislative regulations.
Would you like to get more information? Look at this page.
Latest update: 2024-07-28 (Number of items: 2 339 194)
© Copyright 2024 NORMSERVIS s.r.o.