Cookies
We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
STN EN 60749-27:2007/A1 (358799)
Semiconductor devices - Mechanical and climatic test methods Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
STANDARD published on 1.4.2013
| Language | |
| Format |
|
| Availability | The sale has ended |
| Price | ONREQUEST excl. VAT |
| ON REQUEST |
The information about the standard:
Designation standards: STN EN 60749-27:2007/A1
Classification mark: 358799
Catalog number: 116779
Note: Change
Publication date standards: 1.4.2013
SKU: NS-528316
Approximate weight : 18 g (0.04 lbs)
Country: Slovak technical standard
Category: Technical standards STN
We recommend simillar standard:!
ČSN EN 60749-27:2007/A1 (01.05.2013)This change (correction) applies to this standard:
STN EN 60749-27 (358799)
Show all technical information.
Semiconductor devices - Mechanical and climatic test methods Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Standard published on 1.5.2007
Selected format: English - Print design (ON REQUEST)
Show all technical information.
We recommend:
Technical standards updating
Do you want to make sure you use only the valid technical standards?
We can offer you a solution which will provide you a monthly overview concerning the updating of standards which you use.
Would you like to know more? Look at this page.
