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Polovodičové súčiastky. Časť 1: Skúška časovo závislého prierazu dielektrika (TDDB) intermetalických vrstiev (Norma na priame používanie ako STN).
Automatically translated name:
Semiconductor devices. Part 1: Test of time-dependent dielectric breakdown ( TDDB ) intermetallic layers (IEC STN ).
STANDARD published on 1.6.2011
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Designation standards: STN EN 62374-1:2011/OpravaAC
Classification mark: 358794
Catalog number: 113426
Note: Correction
Publication date standards: 1.6.2011
SKU: NS-532087
Approximate weight : 12 g (0.03 lbs)
Country: Slovak technical standard
Category: Technical standards STN
Polovodičové súčiastky. Časť 1: Skúška časovo závislého prierazu dielektrika (TDDB) intermetalických vrstiev (Norma na priame používanie ako STN).
Standard published on 1.4.2011
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