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Polovodičové súčiastky. Skúška pohyblivých iónov v poľom riadených tranzistoroch s hradlom izolovaným oxidom kovu (MOSFET) (Norma na priame používanie ako STN).
Automatically translated name:
Semiconductor devices. Test mobile ions in field effect transistors metal oxide semiconductor (MOSFET) (IEC STN).
STANDARD published on 1.10.2010
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Designation standards: STN EN 62417
Classification mark: 358778
Catalog number: 111791
Publication date standards: 1.10.2010
SKU: NS-532132
The number of pages: 10
Approximate weight : 30 g (0.07 lbs)
Country: Slovak technical standard
Category: Technical standards STN
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