Standards IEC - International electro-technical commission - Page 1069

Fibre optic interconnecting devices and passive components - Fibre optic connector optical interfaces - Part 3-30: End face geometry - Angled PC end face PPS rectangular ferrule multimode A1b fibres

Standard published on 27.5.2021

Fibre optic interconnecting devices and passive components - Fibre optic connector optical interfaces - Part 3-31: End face geometry - Flat PC PPS rectangular ferrule multimode fibres

Standard published on 7.2.2020

Energy and data interfaces of users connected to the smart grid with other smart grid stakeholders - Standardization landscape

Standard published on 29.10.2020

Maritime navigation and radiocommunication equipment and systems - Maritime survivor locating devices (man overboard devices) - Minimum requirements, methods of testing and required test results
(Materiels et systemes de navigation et de radiocommunication maritimes - Dispositifs de localisation des survivants en mer (dispositifs en cas d´homme a la mer) - Exigences minimales, methodes d´essai et resultats d´essai exiges)

Standard published on 25.5.2022

Nuclear facilities - Electrical power systems - AC interruptible power supply systems
(Installations nucleaires - Systemes d´alimentation electrique - Systemes d´alimentation electrique interruptibles en courant alternatif)

Standard published on 7.8.2024

Smart city use case collection and analysis - City information modelling - Part 1: High-level analysis

Standard published on 25.8.2023

Smart city use case collection and analysis - City information modelling - Part 2: Use case analysis

Standard published on 3.4.2024

Power consumption of high dynamic range television sets

Standard published on 5.3.2021

Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 1: Test method for bias temperature instability
(Dispositifs a semiconducteurs - Methode d’essai de fiabilite pour les transistors a effet de champ metal-oxyde-semiconducteurs discrets en carbure de silicium - Partie 1: Methode d’essai pour la mesure de la derive de la tension de seuil apres polarisation electrique en temperature)

Standard published on 21.4.2022

Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 2: Test method for bipolar degradation due to body diode operation
(Dispositifs a semiconducteurs - Methode d’essai de fiabilite pour les transistors a effet de champ metal-oxyde-semiconducteurs discrets en carbure de silicium - Partie 2: Methode d’essai de la degradation bipolaire due au fonctionnement de la diode intrinseque)

Standard published on 11.5.2022