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Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
STANDARD published on 10.9.1997
Designation standards: ASTM E1523-97
Note: WITHDRAWN
Publication date standards: 10.9.1997
SKU: NS-42064
The number of pages: 4
Approximate weight : 12 g (0.03 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
change control, charge referencing, charging, X-ray photoelectron spectroscopy, ICS Number Code 71.040.50 (Physicochemical methods of analysis)
1. Scope | ||||||||
1.1 This guide covers the acquainting of the XPS user with the various charge control and charge shift referencing techniques that are and have been used in the acquisition and interpretation of X-ray photoelectron spectroscopy (XPS) data from surfaces of insulating specimens. 1.2 This guide is intended to apply to charge control and charge referencing techniques in XPS and is not necessarily applicable to electron-excited systems. 1.3 SI units are standard unless otherwise noted. 1.4 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. |
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2. Referenced Documents | ||||||||
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