Change ČSN EN 60749-19:2003/A1 1.5.2011 preview

ČSN EN 60749-19:2003/A1 (358799)

Polovodičové součástky - Mechanické a klimatické zkoušky - Část 19: Zkouška pevnosti čipu střihem. (Norma přebírající anglický originál, vlastní text je součástí výtisku).

Automatically translated name:

Semiconductor devices - Mechanical and climatic test methods - Part 19 : Test of strength of the chip cut. ( In English , the text is part of a copy ).



STANDARD published on 1.5.2011


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The information about the standard:

Designation standards: ČSN EN 60749-19:2003/A1
Classification mark: 358799
Catalog number: 88188
Note: Change
Publication date standards: 1.5.2011
SKU: NS-158209
The number of pages: 12
Approximate weight : 36 g (0.08 lbs)
Country: Czech technical standard
Category: Technical standards ČSN

The category - similar standards:

Semiconductor devices in general

This change (correction) applies to this standard:

ČSN EN 60749-19 (358799)

Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength

Standard published on 1.12.2003

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