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ČSN EN 60749-23:2004/A1 (358799)
Polovodičové součástky - Mechanické a klimatické zkoušky - Část 23: Zkouška životnosti při zvýšené teplotě. (Norma přebírající anglický originál, vlastní text je součástí výtisku).
Automatically translated name:
Semiconductor devices - Mechanical and climatic test methods - Part 23 : durability test at elevated temperature. ( In English , the text is part of a copy ).
STANDARD published on 1.11.2011
The information about the standard:
Designation standards: ČSN EN 60749-23:2004/A1
Classification mark: 358799
Catalog number: 89373
Note: Change
Publication date standards: 1.11.2011
SKU: NS-158219
The number of pages: 12
Approximate weight : 36 g (0.08 lbs)
Country: Czech technical standard
Category: Technical standards ČSN
The category - similar standards:
This change (correction) applies to this standard:
ČSN EN 60749-23 (358799)
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Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Standard published on 1.12.2004
Selected format: English (the title page in Czech only) - Print design (14.00 USD)
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