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Standard ČSN EN 62418 1.1.2011 preview

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ČSN EN 62418 (358772)

Semiconductor devices - Metallization stress void test (IEC 62418:2010)



STANDARD published on 1.1.2011


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The information about the standard:

Designation standards: ČSN EN 62418
Classification mark: 358772
Catalog number: 87502
Publication date standards: 1.1.2011
SKU: NS-162134
The number of pages: 44
Approximate weight : 132 g (0.29 lbs)
Country: Czech technical standard
Category: Technical standards ČSN

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Semiconductor devices in general

Preview of the standard ČSN EN 62418 (358772)

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