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IEC 60749-24-ed.1.0
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
STANDARD published on 9.3.2004
The information about the standard:
Designation standards: IEC 60749-24-ed.1.0
Publication date standards: 9.3.2004
SKU: NS-411389
The number of pages: 19
Approximate weight : 57 g (0.13 lbs)
Country: International technical standard
Category: Technical standards IEC
The category - similar standards:
Annotation of standard text IEC 60749-24-ed.1.0 :
The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it. L essai de resistance a lhumidite acceleree sans polarisation est realise dans le but devaluer la fiabilite des dispositifs a letat solide sous boitiers non hermetiques dans des environnements humides. Utilise une temperature et une humidite dans des conditions sans condensation, pour accelerer la penetration dhumidite a travers le materiau de protection exterieur (agent denrobage ou de scellement) ou par linterface entre le materiau de protection exterieur et les conducteurs metalliques qui le traversent.
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