We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
Semiconductor devices - Mechanical and climatic test methods Part 35: Acoustic microscopy for plastic encapsulated electronic components
STANDARD published on 1.6.2007
Language | |
Format |
|
Availability | The sale has ended |
Price | ONREQUEST excl. VAT |
ON REQUEST |
Designation standards: STN EN 60749-35
Classification mark: 358799
Catalog number: 103750
Publication date standards: 1.6.2007
SKU: NS-528329
The number of pages: 28
Approximate weight : 84 g (0.19 lbs)
Country: Slovak technical standard
Category: Technical standards STN
WITHDRAWN
1.11.2003
WITHDRAWN
1.10.2003
1.11.2003
WITHDRAWN
1.4.2010
1.9.2009
1.12.2011
Do you want to make sure you use only the valid technical standards?
We can offer you a solution which will provide you a monthly overview concerning the updating of standards which you use.
Would you like to know more? Look at this page.
Latest update: 2024-12-22 (Number of items: 2 217 000)
© Copyright 2024 NORMSERVIS s.r.o.