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STN EN 60749-19 (358799)
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
STANDARD published on 1.11.2003
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The information about the standard:
Designation standards: STN EN 60749-19
Classification mark: 358799
Catalog number: 92001
Publication date standards: 1.11.2003
SKU: NS-528300
The number of pages: 23
Approximate weight : 69 g (0.15 lbs)
Country: Slovak technical standard
Category: Technical standards STN
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These changes apply to this standard:
STN EN 60749-19:2003/A1 (358799)
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Change published on 1.12.2010
Selected format: English - Print design (ON REQUEST)
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