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Standard STN EN 60749-38 1.1.2009 preview

STN EN 60749-38 (358799)

Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory



STANDARD published on 1.1.2009


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The information about the standard:

Designation standards: STN EN 60749-38
Classification mark: 358799
Catalog number: 107323
Publication date standards: 1.1.2009
SKU: NS-528332
The number of pages: 17
Approximate weight : 51 g (0.11 lbs)
Country: Slovak technical standard
Category: Technical standards STN

We recommend simillar standard:!

ČSN EN 60749-38 (01.10.2008)

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The category - similar standards:

Semiconductor devices in general

Similar standards:

STN EN 60749STN EN 60749

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1.8.2001

STN EN 60749-1STN EN 60749-1

1.1.2004

STN EN 60749-2STN EN 60749-2

1.2.2003

STN EN 60749-3STN EN 60749-3

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1.2.2003

STN EN 60749-4STN EN 60749-4

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1.2.2003

STN EN 60749-5STN EN 60749-5

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1.10.2003

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