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Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 62047-6:2009)
STANDARD published on 1.11.2010
Designation standards: ČSN EN 62047-6
Classification mark: 358775
Catalog number: 86158
Publication date standards: 1.11.2010
SKU: NS-161589
The number of pages: 24
Approximate weight : 72 g (0.16 lbs)
Country: Czech technical standard
Category: Technical standards ČSN
Semiconductor devices in generalElectromechanical components in general
1.11.2003
WITHDRAWN
1.12.2003
WITHDRAWN
1.8.2003
1.12.2003
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1.5.2010
1.12.2009
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