We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 62047-6:2009)
STANDARD published on 1.11.2010
Designation standards: ČSN EN 62047-6
Classification mark: 358775
Catalog number: 86158
Publication date standards: 1.11.2010
SKU: NS-161589
The number of pages: 24
Approximate weight : 72 g (0.16 lbs)
Country: Czech technical standard
Category: Technical standards ČSN
Semiconductor devices in generalElectromechanical components in general
1.11.2003
WITHDRAWN
1.12.2003
WITHDRAWN
1.8.2003
1.12.2003
WITHDRAWN
1.5.2010
1.12.2009
Do you want to make sure you use only the valid technical standards?
We can offer you a solution which will provide you a monthly overview concerning the updating of standards which you use.
Would you like to know more? Look at this page.
Latest update: 2024-11-22 (Number of items: 2 206 568)
© Copyright 2024 NORMSERVIS s.r.o.