Cookies
We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
ČSN EN 62374-1 (358768)
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
STANDARD published on 1.7.2011
The information about the standard:
Designation standards: ČSN EN 62374-1
Classification mark: 358768
Catalog number: 88688
Publication date standards: 1.7.2011
SKU: NS-162086
The number of pages: 28
Approximate weight : 84 g (0.19 lbs)
Country: Czech technical standard
Category: Technical standards ČSN
The category - similar standards:
Annotation of standard text ČSN EN 62374-1 (358768):
Tato norma popisuje zkušební metodu, zkušební strukturu a metodu pro odhad životnosti pro zkoušku časově závislého dielektrického průrazu (TDDB) pro intermetalické vrstvy vytvořené pro polovodičové součástky
Preview of the standard ČSN EN 62374-1 (358768)
Similar standards:
1.12.2003
WITHDRAWN
1.4.2003
1.4.2003
1.4.2003
WITHDRAWN
1.4.2003
WITHDRAWN
1.4.2003
We recommend:
Technical standards updating
Do you want to make sure you use only the valid technical standards?
We can offer you a solution which will provide you a monthly overview concerning the updating of standards which you use.
Would you like to know more? Look at this page.
