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Normalizácia rozmerov polovodičových súčiastok. Časť 6-19: Metódy merania deformácie puzdra pri zvýšenej teplote a maximálna dovolená deformácia (Norma na priame používanie ako STN).
Automatically translated name:
Standardization of semiconductor devices. Part 6-19: Measurement methods casing deformation at elevated temperature and the maximum permissible deformation (IEC STN).
STANDARD published on 1.10.2010
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Designation standards: STN EN 60191-6-19
Classification mark: 358791
Catalog number: 111781
Publication date standards: 1.10.2010
SKU: NS-525864
The number of pages: 15
Approximate weight : 45 g (0.10 lbs)
Country: Slovak technical standard
Category: Technical standards STN
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