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Standard ČSN EN 62374 1.5.2008 preview

ČSN EN 62374 (358768)

Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films



STANDARD published on 1.5.2008


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The information about the standard:

Designation standards: ČSN EN 62374
Classification mark: 358768
Catalog number: 80891
Publication date standards: 1.5.2008
SKU: NS-162087
The number of pages: 48
Approximate weight : 144 g (0.32 lbs)
Country: Czech technical standard
Category: Technical standards ČSN

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The category - similar standards:

Semiconductor devices in general

Annotation of standard text ČSN EN 62374 (358768):

Norma stanovuje metodu pro zkoušení časově závislého průrazu dielektrika hradel (TDDB) a odhad tržní životnosti hradel podle výsledků této zkoušky.

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