ČSN EN 62415 (358771)

Semiconductor devices - Constant current electromigration test (IEC 62415:2010)



STANDARD published on 1.12.2010


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9.20 USD

The information about the standard:

Designation standards: ČSN EN 62415
Classification mark: 358771
Catalog number: 87220
Publication date standards: 1.12.2010
SKU: NS-162131
The number of pages: 20
Approximate weight : 60 g (0.13 lbs)
Country: Czech technical standard
Category: Technical standards ČSN

The category - similar standards:

Semiconductor devices in general



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