Cookies
We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
STN EN 60749-23 (358799)
Semiconductor devices – Mechanical and climatic test methods Part 23: High temperature operating life
STANDARD published on 1.10.2004
| Language | |
| Format |
|
| Availability | The sale has ended |
| Price | ONREQUEST excl. VAT |
| ON REQUEST | |
|
|
The information about the standard:
Designation standards: STN EN 60749-23
Classification mark: 358799
Catalog number: 96505
Publication date standards: 1.10.2004
SKU: NS-528311
The number of pages: 29
Approximate weight : 87 g (0.19 lbs)
Country: Slovak technical standard
Category: Technical standards STN
We recommend simillar standard:!
ČSN EN 60749-23 (01.12.2004)The category - similar standards:
These changes apply to this standard:
STN EN 60749-23:2004/A1 (358799)
Change
Show all technical information.
Change published on 1.6.2011
Selected format: English - Print design (ON REQUEST)
Show all technical information.
Similar standards:
1.9.2009
1.12.2011
1.1.2004
1.10.2004
1.3.2004
WITHDRAWN
1.5.2007
We recommend:
Technical standards updating
Do you want to make sure you use only the valid technical standards?
We can offer you a solution which will provide you a monthly overview concerning the updating of standards which you use.
Would you like to know more? Look at this page.
