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STN EN 60749-23:2004/A1 (358799)
Semiconductor devices – Mechanical and climatic test methods Part 23: High temperature operating life
STANDARD published on 1.6.2011
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The information about the standard:
Designation standards: STN EN 60749-23:2004/A1
Classification mark: 358799
Catalog number: 113338
Note: Change
Publication date standards: 1.6.2011
SKU: NS-528310
Approximate weight : 21 g (0.05 lbs)
Country: Slovak technical standard
Category: Technical standards STN
We recommend simillar standard:!
ČSN EN 60749-23:2004/A1 (01.11.2011)This change (correction) applies to this standard:
STN EN 60749-23 (358799)
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Semiconductor devices – Mechanical and climatic test methods Part 23: High temperature operating life
Standard published on 1.10.2004
Selected format: English - Print design (ON REQUEST)
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