Change STN EN 60749-23:2004/A1 1.6.2011 preview

STN EN 60749-23:2004/A1 (358799)

Semiconductor devices – Mechanical and climatic test methods Part 23: High temperature operating life



STANDARD published on 1.6.2011


Language
Format
AvailabilityThe sale has ended
PriceON REQUEST excl. VAT
ON REQUEST

The information about the standard:

Designation standards: STN EN 60749-23:2004/A1
Classification mark: 358799
Catalog number: 113338
Note: Change
Publication date standards: 1.6.2011
SKU: NS-528310
Approximate weight : 21 g (0.05 lbs)
Country: Slovak technical standard
Category: Technical standards STN

We recommend simillar standard:!

ČSN EN 60749-23:2004/A1 (01.11.2011)

This change (correction) applies to this standard:

STN EN 60749-23 (358799)

Semiconductor devices – Mechanical and climatic test methods Part 23: High temperature operating life

Standard published on 1.10.2004

We recommend simillar standard:!
ČSN EN 60749-23 (01.12.2004)
Selected format:
English -
Print design (ON REQUEST)


Show all technical information.
ON REQUEST


The sale has ended


Cookies Cookies

We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.

You can refuse consent here.

Here you can customize your cookie settings according to your preferences.

We need your consent to use the individual data so that you can see information about your interests, among other things.