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Semiconductor devices – Mechanical and climatic test methods Part 23: High temperature operating life
STANDARD published on 1.6.2011
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Designation standards: STN EN 60749-23:2004/A1
Classification mark: 358799
Catalog number: 113338
Note: Change
Publication date standards: 1.6.2011
SKU: NS-528310
Approximate weight : 21 g (0.05 lbs)
Country: Slovak technical standard
Category: Technical standards STN
Semiconductor devices – Mechanical and climatic test methods Part 23: High temperature operating life
Standard published on 1.10.2004
Selected format:Latest update: 2024-07-28 (Number of items: 2 339 194)
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